8, 9, 10, 11, 12, 13, 14, 15 In particular, silicate glass corrosion work is of great interest for heritage material conservation, 16, 17 geochemistry, 18 and nuclear waste management. 7 ToF-SIMS depth profiling capacity is also particularly interesting for the corrosion community, because it facilitates the characterization of both pristine and altered materials, and allows the proposition of formation mechanisms for the latter. To take some examples, ToF-SIMS has been successfully applied to many scientific issues, such as medical research, 3, 4, 5 the polymer industry, 6 or space research. Despite ToF-SIMS lower sensitivity compared to D-SIMS, it is possible to use this technique with caution to characterize various types of layers. Furthermore, Nano-SIMS analysis usually requires extensive sample preparation, while ToF-SIMS and D-SIMS can be applied directly on the sample surface (provided that its surface is flat). 1 Nano-SIMS analysis provides the best lateral resolution, but this is obtained at the expense of depth resolution. ![]() Time-of-flight secondary ion mass spectrometry (ToF-SIMS) for example has a good depth resolution (potentially < 1 nm), better than that of dynamic secondary ion mass spectrometry (D-SIMS), but is less sensitive. 2 Various SIMS modes currently exist, each with their advantages and limitations. 1 During SIMS analysis, a focused primary ion beam hit the sample surface, resulting in the production of secondary ions from the sample surface that can be collected for mass spectrometry analysis. It has been used since its development to detect nearly all elements of the periodic table regardless of their weight, even as trace elements. Secondary ion mass spectrometry (SIMS) is a powerful, isotope sensitive, analytical tool for surfaces, and sub-surfaces characterization. No impact is observed on 18O and H, but it is demonstrated that quantification of isotopic ratios is possible only for a limited range of isotopic enrichment. We highlight the beam effect on cations weakly bonded to the silicate network (Li, Na, K, and B, Ca, Cs to a lesser extent) affecting the profile shape of these elements. A thin flake of glass partially altered on both sides is analyzed entirely from one side to the other to determine whether atoms weakly bonded to the solid are displaced by the beams. In particular, we focus on the potential impact of the ToF-SIMS ion beam on the distribution of several elements of interest in alteration layers formed on International Simple Glass, a six-oxide reference glass altered in a solution enriched in alkalis and spiked with H 2 18O. In this study, we investigate the capabilities and limitations of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to better understand chemical processes of glass corrosion. ![]() Glass and mineral corrosion usually leads to the formation of morphologically and compositionally complex surface layers that can be characterized by various analytical techniques to infer rate control mechanisms.
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